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Wire Bonding Parameters

Semiconductor wire bonding process parameters — bond pad pitch, wire diameter, loop height, pull strength, ball shear strength, bonding temperature, ultrasonic frequency/power, bonding force, and wire mechanical properties by bond type and wire material. Covers ball bonding (Au, Cu, Pd-coated Cu), wedge bonding (Al, Au), ribbon bonding (Au and Al ribbon), and heavy-wire aluminum bonding for power modules. Minimum strength values per MIL-STD-883 Method 2011 and JEDEC JESD22-B116.

Electrical Engineering7 sections18 sample rowsKey: bond_type

Attributes

wire_material
wire_diameter_umum
wire_diameter_milmil
bond_pad_pitch_min_umum
loop_height_min_umum
loop_height_max_umum
pull_strength_min_gfgf
pull_strength_typical_gfgf
ball_shear_min_gfgf
ball_shear_typical_gfgf
bond_temp_substrate_C
bond_temp_min_CC
bond_temp_max_CC
ultrasonic_freq_kHzkHz
ultrasonic_power_mWmW
bonding_force_gfgf
bond_time_msms
wire_tensile_strength_gfgf
wire_elongation_pctpct
ball_to_pad_diameter_ratio_mindimensionless
ball_to_pad_diameter_ratio_maxdimensionless
notes

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