Semiconductor Thermal Data: MOSFET

Thermal resistance and power dissipation data for semiconductor power devices — MOSFETs, IGBTs, SiC MOSFETs, GaN HEMTs, power diodes, Schottky diodes, and thyristor/SCRs. Covers TO-220, TO-247, TO-263 D2PAK, TO-252 DPAK, SO-8, QFN, and 62mm/34mm power module packages. Each record includes junction-to-case (Rth_jc), case-to-sink (Rth_cs), and junction-to-ambient (Rth_ja) thermal resistances, maximum junction temperature, power dissipation, switching loss, on-resistance or Vce_sat/Vf, and voltage/current ratings. 49 records across 7 device categories.

Mechanical Engineeringdevice_type: MOSFET3 rows
device typedevice keyRth cs C per W (degC/W)Rth ja C per W (degC/W)Rth jc C per W (degC/W)Tj max C (degC)current rating A (A)noteson resistance mOhm (mOhm)package typepower dissipation max W (W)voltage rating V (V)
MOSFETQFN#30#400.5554.51754030V QFN exposed-pad; Rth_ja with minimal copper area; represents DrMOS class3.5QFN1630
MOSFETSO-8#30#30110081753030V SO-8 dual or single; Rth_ja estimated with 1oz copper pour; Ron at Vgs=10V4SO-8330
MOSFETSO-8#60#161100101751660V SO-8; low-current applications; Ron at Vgs=10V20SO-8260

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